Advanced Characterization Techniques for Thin Film Solar Cells. (2016)

• Record Type: Book
• Further Information: Note: Daniel Abou-Ras, Thomas Kirchartz, Uwe Rau.
• Editors: Abou-Ras, Daniel; Kirchartz, Thomas; Rau, Uwe
• Contents: PART I. INTRODUCTION; 1 INTRODUCTION TO THIN-FILM PHOTOVOLTAICS; Introduction; The Photovoltaic Principle; Functional Layers in Thin-Film Solar Cells; Comparison of Various Thin-Film Solar-Cell Types; PART II. DEVICE CHARACTERIZATION; 2 FUNDAMENTAL ELECTRICAL CHARACTERIZATION OF THIN-FILM SOLAR CELLS; Introduction; Current/Voltage Curves; Quantum Efficiency Measurements; 3 ELECTROLUMINESCENCE ANALYSIS OF SOLAR CELLS AND SOLAR MODULES; Introduction; Basics; Spectrally Resolved Electroluminescence; Spatially Resolved Electroluminescence of c-Si Solar Cells; Electroluminescence Imaging of Cu(In, Ga)Se2 Thin-Film Modules; Modeling of Spatially Resolved Electroluminescence; 4 CAPACITANCE SPECTROSCOPY OF THIN-FILM SOLAR CELLS; Introduction; Admittance Basics; Sample Requirements; Instrumentation; Capacitance-Voltage Profiling and the Depletion Approximation; Admittance Response of Deep States; The Influence of Deep States on CV Profiles; DLTS; Admittance Spectroscopy; Drive Level Capacitance Profiling; Photocapacitance; The Meyer-Neldel Rule; Spatial Inhomogeneities and Interface States; Metastability; 5 LOCK THERMOGRAPHY; PART III. MATERIALS CHARACTERIZATION; 6 CHARACTERIZING THE LIGHT-TRAPPING PROPERTIES OF TEXTURED SURFACES WITH SCANNING NEAR-FIELD OPTICAL; Introduction; How Does a Scanning Near-Field Optical Microscope Work?; Light Scattering in the Wave Picture; The Role of Evanescent Modes for Light Trapping; Analysis of Scanning Near-Field Optical Microscopy Images by Fast Fourier Transformation; How to Extract Far-Field Scattering Properties by Scanning Near-Field Optical Microscopy?; 7 SPECTROSCOPIC ELLIPSOMETRY; Introduction; Theory; Ellipsometry Instrumentation; Data Analysis; RTSE of Thin Film Photovoltaics; Summary and Future; Definition of Variables; 8 PHOTOLUMINESCENCE ANALYSIS OF THIN-FILM SOLAR CELLS; Introduction; Experimental Issues; Basic Transitions; Case Studies; 9 STEADY-STATE PHOTOCARRIER GRATING METHOD; Introduction; Basic Analysis of SSPG and Photocurrent Response; Experimental Setup; Data Analysis; Results; Density-of-States Determination; 10 TRANSIENT OPTOELECTRONIC METHODS; Introduction; Time of Flight; Transient Photocurrent (incl. CE, CELIV, TDCF); Transient Photovoltage; 11 ELECTRON-SPIN RESONANCE (ESR) IN HYDROGENATED AMORPHOUS SILICON (A-SI:H); Introduction; Basics of ESR; How to Measure ESR; The g Tensor and Hyperfine Interaction in Disordered Solids; Discussion of Selected Results; Alternative ESR Detection; 12 SCANNING PROBE MICROSCOPY ON INORGANIC THIN FILMS FOR SOLAR CELLS; Introduction; Experimental Background; Selected Applications; 13 ELECTRON MICROSCOPY ON THIN FILMS FOR SOLAR CELLS; Introduction; Scanning Electron Microscopy; Transmission Electron Microscopy; Sample Preparation Techniques; 14 X-RAY AND NEUTRON DIFFRACTION ON MATERIALS FOR THIN-FILM SOLAR CELLS; Introduction; Diffraction of X-Rays and Neutron by Matter; Neutron Powder Diffraction of Absorber Materials for Thin-Film Solar Cells; Grazing Incidence X-Ray Diffraction (GIXRD); Energy Dispersive X-Ray Diffraction (EDXRD); 15 RAMAN SPECTROSCOPY ON THIN FILMS FOR SOLAR CELLS; Introduction; Fundamentals of Raman Spectroscopy; Vibrational Modes in Crystalline Materials; Experimental Considerations; Characterization of Thin-Film Photovoltaic Materials; 16 SOFT X-RAY AND ELECTRON SPECTROSCOPY: A UNIQUE "TOOL CHEST" TO CHARACTERIZE THE CHEMICAL AND ELECTRONIC PROPERTIES OF SURFACES AND INTERFACES; Introduction; Characterization Techniques; Probing the Chemical Surface Structure: Impact of Wet Chemical Treatments on Thin-Film Solar-Cell Absorbers; Probing the Electronic Surface and Interface Structure: Band Alignment in Thin-Film Solar Cells; 17 ELEMENTAL DISTRIBUTION PROFILING OF THIN FILMS FOR SOLAR CELLS; Introduction; Glow Discharge-Optical Emission (GD-OES) and Glow Discharge-Mass Spectroscopy (GD-MS); Secondary Ion Mass Spectrometry (SIMS); Auger Electron Spectroscopy (AES); X-Ray Photoelectron Spectroscopy (XPS); Energy-Dispersive X-Ray Analysis on Fractured Cross Sections; 18 HYDROGEN EFFUSION EXPERIMENTS; Introduction; Experimental Set
• Edition: 2nd
• Publisher Details: Wiley-VCH
• Publication Date: 2016
• Extent: 1 online resource (350 pages)
• Subjects: 621.472
• Languages: English
• ISBNs: 9783527699049
• Access Rights: Legal Deposit; Only available on premises controlled by the deposit library and to one user at any one time; The Legal Deposit Libraries (Non-Print Works) Regulations (UK).
• Access Usage: Restricted: Printing from this resource is governed by The Legal Deposit Libraries (Non-Print Works) Regulations (UK) and UK copyright law currently in force.