An essential guide to electronic material surfaces and interfaces. (2016)

• Record Type: Book
• Further Information: Note: By Leonard J. Brillson, Ohio State University.
• Authors: Brillson, L. J
• Contents: Why surfaces and interfaces of electronic materials -- Semiconductor electronic and optical properties -- Electrical measurements of surfaces and interfaces -- Localized states at surfaces and interfaces -- Ultrahigh vacuum technology -- Surface and interface analysis -- Surface and interface spectroscopies -- Dynamical depth-dependent analysis and imaging -- Electron beam diffraction and microscopy of atomic-scale geometrical structure -- Scanning probe techniques -- Optical spectroscopies -- Electronic material surfaces -- Surface electronic applications -- Semiconductor heterojunctions -- Metal-semiconductor interfaces -- Next generation surfaces and interfaces.
• Publisher Details: Place of publication not identified : Wiley
• Publication Date: 2016
• Extent: 1 online resource (320 pages)
• Subjects: 621.381; Electronics -- Materials; Surfaces (Technology) -- Analysis; Spectrum analysis; Semiconductors -- Materials
• Languages: English
• ISBNs: 9781119027126
• Access Rights: Legal Deposit; Only available on premises controlled by the deposit library and to one user at any one time; The Legal Deposit Libraries (Non-Print Works) Regulations (UK).
• Access Usage: Restricted: Printing from this resource is governed by The Legal Deposit Libraries (Non-Print Works) Regulations (UK) and UK copyright law currently in force.