In-circuit testing. (1994)

• Record Type: Book
• Further Information: Note: Allen Buckroyd.
• Other Names: Buckroyd, Allen
• Contents: Front Cover; In-Circuit Testing; Copyright Page; Table of Contents; Preface; Abbreviations; Chapter 1. Introduction; 1.1 What is ICT?; 1.2 What does ICT do?; 1.3 What does ICT not do?; 1.4 How does ICT work?; 1.5 What faults can be found by ICT?; 1.6 ICT of surface mounted assemblies; 1.7 ICT ATE suppliers; 1.8 References; Chapter 2. Application; Preamble; 2.1 A typical application; 2.2 The wrong use of ICT; 2.3 The correct use of ICT; 2.4 ICT in the test strategy; 2.5 Fitting ICT into manufacturing; 2.6 Buying an ICT equipment; 2.7 Cost of ownership/LCC; 2.8 Additional factors 2.9 The financial decision2.10 Presenting the justification to management; 2.11 Break-even table; 2.12 References; Chapter 3. Programming -- procedures, problems and solutions; 3.1 Introduction; 3.2 Standard procedures; 3.3 The standard program; 3.4 Software; 3.5 Guarding; 3.6 Programming requirements; 3.7 Programming workstations; 3.8 Summary; Chapter 4. Interfacing -- procedures, problems and solutions; 4.1 Introduction; 4.2 The ATE; 4.3 The basic fixture; 4.4 The test probe; 4.5 Drilling the platten; 4.6 Wiring the fixture; 4.7 Problems; 4.8 Fixture maintenance; 4.9 Vacuum pumps 4.10 Summary4.11 References; Chapter 5. Fault diagnosis; Preamble; 5.1 Short circuits; 5.2 Open circuits; 5.3 Faulty analogue components; 5.4 Assembly faults; 5.5 Faulty digital components; 5.6 Faults generated in test; 5.7 Rework and repair stations; 5.8 Summary; 5.9 References; Chapter 6. Designing for in-circuit test; 6.1 General; 6.2 Mechanical design of the PCB; 6.3 Formal rules for testability; 6.4 Mechanical requirements; 6.5 CAD aspects; 6.6 Design for test checklist; References; Chapter 7. Conclusion; 7.1 Analysing the strategy; 7.2 Refining the strategy; 7.3 Cost effectiveness 7.4 Fault analysis and feedback7.5 ICT and yield; 7.6 Boundary scan; 7.7 Automatic board handlers; 7.8 Real time fault analysis; 7.9 Computer integrated test; 7.10 Test area management; 7.11 Conclusion; 12. References; Index
• Publisher Details: Jordan Hill, Oxford, England Boston : Butterworth-Heinemann
• Publication Date: 1994
• Extent: 1 online resource (xiv, 168 pages), illustrations
• Subjects: 621.3815/31/0287; Printed circuits -- Testing; TECHNOLOGY & ENGINEERING -- Mechanical; Printed circuits -- Testing; Electronic books; Electronic books
• Languages: English
• ISBNs: 9781483144498; 1483144496
• Related ISBNs: 0750609303; 9780750609302
• Notes: Note: Includes bibliographical references and index.; Note: Print version record.
• Access Rights: Legal Deposit; Only available on premises controlled by the deposit library and to one user at any one time; The Legal Deposit Libraries (Non-Print Works) Regulations (UK).
• Access Usage: Restricted: Printing from this resource is governed by The Legal Deposit Libraries (Non-Print Works) Regulations (UK) and UK copyright law currently in force.