Reliability and failure of electronic materials and devices. (2014)

• Record Type: Book
• Further Information: Note: Milton Ohring, Lucian Kasprzak.
• Other Names: Ohring, Milton, 1936-; Kasprzak, Lucian
• Contents: FrontCover; FM-CTR-01; DEDICATION; CONTENTS; Chapter 11 -- Characterization and Failure Analysis of Materials and Devices; PREFACE TO THE FIRST EDITION; 1.1 ELECTRONIC PRODUCTS; 1.3 FAILURE PHYSICS; 1.4 SUMMARY AND PERSPECTIVE; REFERENCES; 2.7 GAAS DEVICES; 2.8 ELECTRO-OPTICAL DEVICES; 2.9 PROCESSING-THE CHIP LEVEL; 2.10 MICROELECTROMECHANICAL SYSTEMS; EXERCISES; REFERENCES; 4.8 EPILOGUE-FINAL COMMENT; EXERCISES; REFERENCES; 5.2 DIFFUSION AND ATOM MOVEMENTS IN SOLIDS; 6.2 ASPECTS OF CONDUCTION IN INSULATORS; 7.2 ATMOSPHERIC CONTAMINATION AND MOISTURE; 8.5 THERMAL STRESSES IN PACKAGE STRUCTURES 9.2 the nature of contacts11.2 nondestructive examination and decapsulation; 12.2 integrated circuit technology trends; acronyms
• Edition: Second edition
• Publisher Details: Amsterdam Boston : Academic Press is an imprint of Elsevier
• Publication Date: 2014
• Extent: 1 online resource
• Subjects: 621.381; Electronic apparatus and appliances -- Reliability; System failures (Engineering); TECHNOLOGY & ENGINEERING -- Mechanical; Electronic apparatus and appliances -- Reliability; System failures (Engineering); Electronic apparatus and appliances -- Reliability; Electronic systems -- Testing; System failures (Engineering); Electronic books; Electronic books
• Languages: English
• ISBNs: 9780080575520; 0080575528
• Related ISBNs: 9780120885749; 0120885743
• Notes: Note: Includes bibliographical references and index.; Note: Print version record.
• Access Rights: Legal Deposit; Only available on premises controlled by the deposit library and to one user at any one time; The Legal Deposit Libraries (Non-Print Works) Regulations (UK).
• Access Usage: Restricted: Printing from this resource is governed by The Legal Deposit Libraries (Non-Print Works) Regulations (UK) and UK copyright law currently in force.