Reliability characterisation of electrical and electronic systems. ([2015])

• Record Type: Book
• Further Information: Note: Edited by Jonathan Swingler.
• Editors: Swingler, Jonathan
• Contents: Front Cover; Reliability Characterisation of Electrical and Electronic Systems; Copyright; Contents; List of contributors; Woodhead Publishing Series in Electronic and Optical Materials; Foreword; Chapter 1: Introduction; 1.1. Introduction; 1.2. The focus of the book; 1.2.1. Reliability characterisation; 1.2.2. Electrical and electronic systems; 1.2.3. The readers and the contributing authors; 1.3. Reliability science and engineering fundamentals (Chapters 2-4Chapter 2Chapter 3Chapter 4); 1.3.1. Reliability and stupidity; 1.3.2. Physics-of-failure thinking. 1.3.3. Acquiring observational evidence1.4. Reliability methods in component and system development (Chapters 5-9Chapter 5Chapter 6Chapter 7Chapter 8Chapter 9); 1.4.1. Components and devices; 1.4.2. Micro- and nanointegrated circuits; 1.4.3. More complex systems; 1.5. Reliability modelling and testing in specific applications (Chapters 10 and 11Chapter 10Chapter 11); 1.5.1. Application examples; 1.5.2. Verification techniques; 1.5.3. Block modelling with ALT techniques; 1.6. Conclusion; References; Chapter 2: Reliability and stupidity; 2.1. Introduction. 2.2. Common mistakes in reliability engineering2.2.1. Inadequate integration of reliability engineering with product development; 2.2.2. Focus on ``probability ́ ́ in conventional definition of reliability engineering; 2.2.3. Quantification of reliability; 2.2.4. Ignoring cause and effect relationship in reliability engineering; 2.2.5. Incorrect understanding of the meaning of MTBF; 2.2.6. Inadequate failure testing during product development; 2.2.7. Reliability engineering activities performed at incorrect time during development. 2.2.8. Reliability engineering activities performed by incorrect personnel2.2.9. Non-value adding reliability engineering activities; 2.2.10. Incorrect viewpoint on cost of reliability; 2.3. Conclusion; References; Chapter 3: Physics-of-failure (PoF) methodology for electronic reliability; 3.1. Introduction; 3.2. Reliability; 3.3. PoF models; 3.4. PoF reliability assessment; 3.5. Applications of PoF to ensure reliability; 3.6. Summary and areas of future interest; References; Chapter 4: Modern instruments for characterizing degradation in electrical and electronic equipment; 4.1. Introduction. 4.1.1. Modern instruments4.2. Destructive techniques; 4.2.1. Cross sections; 4.2.2. Jet etching and depotting components; 4.2.3. Chemical analysis; 4.2.3.1. Ion chromatography; 4.2.3.2. Infrared spectroscopy; 4.2.3.3. Raman spectroscopy; 4.2.3.4. Mass spectrometric techniques; 4.2.3.5. SEM imaging with energy-dispersive X-ray and wavelength-dispersive X-ray analyses; 4.2.3.6. Focused ion beam sample preparation; 4.2.3.7. Transmission electron microscopy (TEM); 4.3. Nondestructive techniques; 4.3.1. Visual inspection; 4.3.2. Optical microscopy; 4.3.2.1. Stereomicroscopes.
• Publisher Details: Cambridge, UK : Woodhead Publishing
• Publication Date: 2015
• Copyright Date: 2015
• Extent: 1 online resource (1 volume), illustrations
• Subjects: 621.4; Electronic systems; Reliability (Engineering); Electronic systems; Reliability (Engineering); Electronic books; Electronic books
• Languages: English
• ISBNs: 9781782422259; 1782422250; 1782422218; 9781782422211
• Related ISBNs: 9781782422211
• Notes: Note: Includes bibliographical references and index.; Note: Online resource; title from cover page (Safari, viewed February 3, 2015).
• Access Rights: Legal Deposit; Only available on premises controlled by the deposit library and to one user at any one time; The Legal Deposit Libraries (Non-Print Works) Regulations (UK).
• Access Usage: Restricted: Printing from this resource is governed by The Legal Deposit Libraries (Non-Print Works) Regulations (UK) and UK copyright law currently in force.