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Subject x-ray diffraction (XRD), -- defects, -- crystal

1. White beam X-ray Diffraction Topography (WBXDT) Studies of Bridgman Grown CdZnTe Crystals. Issue 1792 (22nd May 2015)

Authors:
Babalola, Stephen; Uba, Samuel; Hossain, Anwar; Camarda, Giuseppe; James, Ralph; Montgomery, Trent
Editors:
Herrick, R.; Miyake, H.; Palacios, T.; Shiojima, K.; Ueda, O.; Chen, Y.; Liliental-Weber, Z.; Narayan, J.; Weber, E.R.
Journal:
MRS proceedings
Issue:
Issue 1792(2015)
Page Start:
Record Type:
Journal Article
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