1. Averaging the intensity of many‐layered structures for accurate stacking‐fault analysis using Rietveld refinement. Issue 5 (29th September 2016) Authors: Coelho, Alan A.; Evans, John S. O.; Lewis, James W. Journal: Journal of applied crystallography Issue: Volume 49:Issue 5(2016) Page Start: 1740 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗