1. Investigation of ramped voltage stress to screen defective magnetic tunnel junctions. (5th December 2017) Authors: Choi, Chulmin; Sukegawa, Hiroaki; Mitani, Seiji; Song, Yunheub Journal: Semiconductor science and technology Issue: Volume 33:Number 1(2018:Jan.) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗