1. Analysis study of sensitive volume and triggering criteria of single‐event burnout in super‐junction metal‐oxide semiconductor field‐effect transistors. Issue 3 (1st May 2014) Authors: Zerarka, Moustafa; Austin, Patrick; Morancho, Frédéric; Isoird, Karine; Arbess, Houssam; Tasselli, Josiane Journal: IET circuits, devices & systems Issue: Volume 8:Issue 3(2014) Page Start: 197 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗