1. Higher accuracy and lower run time: efficient mutation analysis using non‐redundant mutation operators. (11th December 2014) Authors: Just, René; Schweiggert, Franz Other Names: Jia Yue guestEditor.; Merayo Mercedes guestEditor.; Harman Mark guestEditor. Journal: Software testing, verification & reliability Issue: Volume 25:Number 5/7(2015) Page Start: 490 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗