1. A new algorithm on the automatic TFT‐LCD mura defects inspection based on an effective background reconstruction. Issue 12 (11th February 2018) Authors: Ngo, Chinh; Park, Yong Jin; Jung, Jeehyun; Hassan, Rizwan Ul; Seok, Jongwon Journal: Journal of the Society for Information Display Issue: Volume 25:Issue 12(2017) Page Start: 737 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗