1. Spline‐Based Drift Analysis for the Reliability of Semiconductor Devices. Issue 8 (10th July 2021) Authors: Hofer, Vera; Nowak, Thomas; Lewitschnig, Horst Journal: Advanced theory and simulations Issue: Volume 4:Issue 8(2021) Page Start: n/a Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗