1. Quasi‐fivefold symmetric electron diffraction patterns due to multiple twinning in silicon thin films grown from hexamethyldisiloxane. Issue 6 (1st December 2016) Authors: Haddad, Farah; Goyal, Prabal; Johnson, Erik V.; Hong, Junegie; Roca i Cabarrocas, Pere; Maurice, Jean-Luc Journal: Journal of applied crystallography Issue: Volume 49:Issue 6(2016) Page Start: 2226 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗