1. HOTFUZ: Cost‐effective higher‐order mutation‐based fault localization. (13th December 2021) Authors: Jang, Jong‐In; Ryu, Duksan; Baik, Jongmoon Other Names: Gopinath Rahul guestEditor.; Zhang Jie M. guestEditor.; Kintis Marinos guestEditor.; Papadakis Mike guestEditor. Journal: Software testing, verification & reliability Issue: Volume 32:Number 8(2022) Page Start: n/a Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗