1. Characterization of Graphene Gate Electrodes for Metal-Oxide-Semiconductor Devices. (19th January 2017) Authors: An, Yanbin; Shekhawat, Aniruddh; Behnam, Ashkan; Pop, Eric; Ural, Ant Journal: MRS advances Issue: Volume 2:Number 2(2017) Page Start: 103 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗