1. Clean-Induced Instability of Electrical Characteristics in Poly-Si Junctionless Nanowire Transistor. (1st January 2017) Authors: Kang, Tsung-Kuei; Chen, Wei-Hao; Liu, Han-Wen; Chien, Feng-Tso; Lin, Cheng-Li; Wang, Fang-Hsing Journal: ECS journal of solid state science and technology Issue: Volume 6:Number 7(2017) Page Start: N83 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Clean-Induced Instability of Electrical Characteristics in Poly-Si Junctionless Nanowire Transistor. (25th May 2017) Authors: Kang, Tsung-Kuei; Chen, Wei-Hao; Liu, Han-Wen; Chien, Feng-Tso; Lin, Cheng-Li; Wang, Fang-Hsing Journal: ECS journal of solid state science and technology Issue: Volume 6:Number 7(2017) Page Start: N83 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗