1. Evaluation of Dislocation Mobility in Wurtzite Semiconductors. Issue 1741 (4th February 2015) Authors: Yonenaga, Ichiro Editors: Albrecht, M.; Aubry, S.; Collazo, R.; Mishra, R. K.; Wu, C-C. Journal: MRS proceedings Issue: Issue 1741:(2015) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗