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Subject defect detection -- histogram feature -- saliency map -- SVM -- visual saliency

1. Fabric defect detection based on saliency histogram features. (7th April 2019)

Authors:
Li, Min; Wan, Shaohua; Deng, Zhongmin; Wang, Yajun
Other Names:
Pang Shaoning guestEditor.; Zhang Xuyun guestEditor.; Ikeda Kazushi guestEditor.; Puthal Deepak guestEditor.; Li Jianxin guestEditor.; Sarrafzahed Abdolhossein guestEditor.
Journal:
Computational intelligence
Issue:
Volume 35:Number 3(2019)
Page Start:
517
Record Type:
Journal Article
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