1. Effect of Wafer Off‐Angles on Defect Formation in Drift Layers Grown on Free‐Standing GaN Substrates. Issue 4 (27th November 2019) Authors: Shiojima, Kenji; Horikiri, Fumimasa; Narita, Yoshinobu; Yoshida, Takehiro; Mishima, Tomoyoshi Other Names: Shadi Shahedipour-Sandvik F. guestEditor.; Qhalid Fareed guestEditor. Journal: Physica status solidi Issue: Volume 257:Issue 4(2020) Page Start: n/a Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗