1. A deep learning approach for predicting critical events using event logs. (22nd February 2021) Authors: Huang, Congfang; Deep, Akash; Zhou, Shiyu; Veeramani, Dharmaraj Journal: Quality and reliability engineering international Issue: Volume 37:Number 5(2021) Page Start: 2214 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗