1. Practical test method for the sensitivity of programmable logic controller to voltage sags and short interruptions. Issue 6 (1st September 2020) Authors: Xu, Zhong; Mo, Wenxiong; Gui, Liangyu; Ma, Zhiyuan; Xiao, Xianyong Journal: IET circuits, devices & systems Issue: Volume 14:Issue 6(2020) Page Start: 830 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗