1. Effect of the molecular weight on the depth profiling of PMMA thin films using low‐energy Cs+ sputtering. (21st July 2021) Authors: Ben Hadj Mabrouk, Amal; Licitra, Christophe; Chateauminois, Antoine; Veillerot, Marc Journal: Surface and interface analysis Issue: Volume 53:Number 10(2021) Page Start: 884 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗