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Subject birefringence microscope -- dislocation -- gallium nitride

1. Demonstration of Observation of Dislocations in GaN by Novel Birefringence Method. Issue 4 (30th December 2019)

Authors:
Tanaka, Atsushi; Inotsume, Syo; Harada, Shunta; Hanada, Kenji; Honda, Yoshio; Ujihara, Toru; Amano, Hiroshi
Other Names:
Shadi Shahedipour-Sandvik F. guestEditor.; Qhalid Fareed guestEditor.
Journal:
Physica status solidi
Issue:
Volume 257:Issue 4(2020)
Page Start:
n/a
Record Type:
Journal Article
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