1. DEMINER: test generation for high test coverage through mutant exploration. (28th October 2019) Authors: Kim, Yunho; Hong, Shin Other Names: Feldt Robert guestEditor.; Yoo Shin guestEditor. Journal: Software testing, verification & reliability Issue: Volume 31:Number 1/2(2021) Page Start: n/a Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗