1. DF-Fit: A Robust Algorithm for Detection of Crystallographic Information in Atom Probe Tomography Data. (31st January 2019) Authors: Haley, Daniel; Bagot, Paul A. J.; Moody, Michael P. Editors: Thuvander, Mattias; Meisenkothen, Frederick; Sha, Gang Journal: Microscopy and microanalysis Issue: Volume 25:Number 2(2019) Page Start: 331 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗