1. Integrating pattern matching and abstract interpretation for verifying cautions of microcontrollers. (19th August 2021) Authors: Nguyen, Thuy; Tomita, Takashi; Endo, Junpei; Aoki, Toshiaki Journal: Software testing, verification & reliability Issue: Volume 31:Number 8(2021) Page Start: n/a Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗