1. Yield-stress based error indicator for adaptive quasi-static yield design of structures. (15th July 2016) Authors: Le, Canh V. Journal: Computers & structures Issue: Volume 171(2016) Page Start: 1 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Yield-stress based error indicator for adaptive quasi-static yield design of structures. (15th July 2016) Authors: Le, Canh V. Journal: Computers & structures Issue: Volume 171(2016) Page Start: 1 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗