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Subject XPS -- XAS -- silicides -- depth analysis

1. Non‐destructive depth analysis of the surface oxide layer on Mg2Si with XPS and XAS. (22nd January 2016)

Authors:
Esaka, Fumitaka; Nojima, Takehiro; Udono, Haruhiko; Magara, Masaaki; Yamamoto, Hiroyuki
Other Names:
Abel Marie‐Laure guestEditor.; Yubero Francesco guestEditor.; Watts John F. guestEditor.
Journal:
Surface and interface analysis
Issue:
Volume 48:Number 7(2016)
Page Start:
432
Record Type:
Journal Article
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