1. RF/Analog performance of GaAs Multi-Fin FinFET with stress effect. (November 2021) Authors: Das, Rinku Rani; Maity, Santanu; Chowdhury, Atanu; Chakraborty, Apurba Journal: Microelectronics journal Issue: Volume 117(2021) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗