1. Can unsupervised machine learning boost the on-site analysis of in situ synchrotron diffraction data?. (15th March 2023) Authors: Strohmann, T.; Barriobero-Vila, P.; Gussone, J.; Melching, D.; Stark, A.; Schell, N.; Requena, G. Journal: Scripta materialia Issue: Number 226(2023) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗