1. Growth and characterization of MoS2/n-GaN and MoS2/p-GaN vertical heterostructure with wafer scale homogeneity. (March 2020) Authors: Lee, Juhun; Jang, Hyunwoo; Kwak, Taemyung; Choi, Uiho; So, Byeongchan; Nam, Okhyun Journal: Solid-state electronics Issue: Volume 165(2020) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗