1. A wafer-level three-step calibration technique for BJT-based CMOS temperature sensor. (January 2023) Authors: Gao, Ying; Liu, Xin; Jiang, Yanfeng Journal: Microelectronics journal Issue: Volume 131(2023) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗