1. A Test Case Generation Approach Based on Sequence Diagram and Automata Models. Issue 2 (1st March 2016) Authors: Zhang, Chen; Duan, Zhenhua; Yu, Bin; Tian, Cong; Ding, Ming Journal: Chinese journal of electronics Issue: Volume 25:Issue 2(2016) Page Start: 234 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗