1. On the accuracy of the formula used to extract trap density in MOSFETs from 1/f noise. (August 2022) Authors: Asanovski, Ruben; Palestri, Pierpaolo; Selmi, Luca Journal: Solid-state electronics Issue: Volume 194(2022) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗