1. Stochastic behavioral models for system level reliability analysis including non-normal and correlated process variation. (March 2021) Authors: Taddiken, Maike; Hillebrand, Theodor; Peters-Drolshagen, Dagmar; Paul, Steffen Journal: Microelectronics and reliability Issue: Volume 118(2021) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗