321. Specification for harmonized system of quality assessment for electronic components. Blank detail specification: tantalum chip capacitors. (31st March 1983) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (13 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
322. Specification for harmonized system of quality assessment for electronic components. Blank detail specification: wirebound inductors with ceramic or ferrite core. Assessment level P. (15th November 1995) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (16 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
323. Specification for harmonized system of quality assessment for electronic components. Blank detail specification: wirewound inductors with ceramic or ferrite core. Assessment level E. (15th November 1995) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (22 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
324. Specification for harmonized system of quality assessment for electronic components. Blank detail specification: wirewound surface mounting inductors of assessed quality. Assessment level P. (15th November 1995) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (18 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
325. Specification for harmonized system of quality assessment for electronic components. Example detail specification/blank detail specification. Two-part and edge socket connectors for printed board application. (15th November 1984) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (20 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
326. Specification for harmonized system of quality assessment for electronic components. Family specification. Digital integrated HC MOS circuits series HC/HCT/HCU. (15th November 1986) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (32 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
327. Specification for harmonized system of quality assessment for electronic components. Family specification: C. MOS digital integrated circuits series 4000 B and 4000 UB. (15th August 1994) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (32 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
328. Specification for harmonized system of quality assessment for electronic components. Family specification: digital integrated TTL low power SCHOTTKY circuits, series 54LS, 64LS, 74LS, 84LS. (2nd June 1987) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (23 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
329. Specification for harmonized system of quality assessment for electronic components. Fixed capacitors for use in electronic equipment. Blank detail specification. Fixed multilayer ceramic chip capacitors. Assessment level E. (15th December 1992) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (14 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
330. Specification for harmonized system of quality assessment for electronic components. Fixed capacitors for use in electronic equipment. Blank detail specification: fixed metallized polycarbonate film dielectric d.c. capacitors. Assessment level E. (31st May 1990) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (16 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗