1. A spatial-phase-shift-based defect detection shearography system with independent adjustment of shear amount and spatial carrier frequency. (April 2020) Authors: Sun, Fangyuan; Dan, Xizuo; Yan, Peizheng; Zhao, Qihan; Zhong, Shimin; Wang, Yonghong Journal: Optics & laser technology Issue: Volume 124(2020) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗