1. Characterizing, modeling, and analyzing soft error propagation in asynchronous and synchronous digital circuits. Issue 1 (January 2015) Authors: Bany Hamad, Ghaith; Hasan, Syed Rafay; Ait Mohamed, Otmane; Savaria, Yvon Journal: Microelectronics and reliability Issue: Volume 55:Issue 1(2015) Page Start: 238 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗