1. A two-level approximate model driven framework for characterizing Multi-Cell Upsets impacts on processors. (February 2016) Authors: Jiao, Jiajia; Marculescu, Diana; Juan, Da-Cheng; Fu, Yuzhuo Journal: Microelectronics journal Issue: Volume 48(2016) Page Start: 7 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗