1. Electron trapping at SiO2/4H-SiC interface probed by transient capacitance measurements and atomic resolution chemical analysis. (18th July 2018) Authors: Fiorenza, Patrick; Iucolano, Ferdinando; Nicotra, Giuseppe; Bongiorno, Corrado; Deretzis, Ioannis; La Magna, Antonino; Giannazzo, Filippo; Saggio, Mario; Spinella, Corrado; Roccaforte, Fabrizio Journal: Nanotechnology Issue: Volume 29:Number 39(2018) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗