1. Failure modes and mechanism analysis of SiC MOSFET under short-circuit conditions. (September 2018) Authors: Jiang, Xi; Wang, Jun; Lu, Jiwu; Chen, Jianjun; Yang, Xin; Li, Zongjian; Tu, Chunming; Shen, Z. John Journal: Microelectronics and reliability Issue: Volume 88/90(2018) Page Start: 593 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗