1. The potential for Bayesian compressive sensing to significantly reduce electron dose in high-resolution STEM images. (22nd October 2013) Authors: Stevens, Andrew; Yang, Hao; Carin, Lawrence; Arslan, Ilke; Browning, Nigel D. Journal: Microscopy Issue: Volume 63:Number 1(2014:Feb.) Page Start: 41 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗