1. Improving the reliability of SRAM-based PUFs under varying operation conditions and aging degradation. (March 2021) Authors: Saraza-Canflanca, P.; Carrasco-Lopez, H.; Santana-Andreo, A.; Brox, P.; Castro-Lopez, R.; Roca, E.; Fernandez, F.V. Journal: Microelectronics and reliability Issue: Volume 118(2021) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗