1. Analysis of 6 T SRAM cell in sub-45 nm CMOS and FinFET technologies. (September 2018) Authors: Almeida, R.B.; Marques, C.M.; Butzen, P.F.; Silva, F.R.G.; Reis, R.A.L.; Meinhardt, C. Journal: Microelectronics and reliability Issue: Volume 88/90(2018) Page Start: 196 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗