Subject: SRAM -- Double-node upset -- Single-node upset -- Low-power - British Library Electronic Legal Deposit Catalogue-Journal Issues and Articles Search Results

Subject SRAM -- Double-node upset -- Single-node upset -- Low-power

1. A highly reliable and low-power cross-coupled 18T SRAM cell. (April 2023)

Authors:: Cai, Shuo; Wen, Yan; Ouyang, Jiangbiao; Wang, Weizheng; Yu, Fei; Li, Bo
Journal:: Microelectronics journal
Issue:: Volume 134(2023)
Page Start:
Record Type:: Journal Article
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