1. Hydrogen-induced program threshold voltage degradation analysis in SONOS wafer. (February 2016) Authors: Lin, Qing; Zhao, Crystal; Sheng, Nan Journal: Solid-state electronics Issue: Volume 116(2016) Page Start: 60 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Hydrogen-induced program threshold voltage degradation analysis in SONOS wafer. (February 2016) Authors: Lin, Qing; Zhao, Crystal; Sheng, Nan Journal: Solid-state electronics Issue: Volume 116(2016) Page Start: 60 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗