1. Forming-ready resistance random access memory using randomly pre-grown conducting filaments via pre-forming. (May 2020) Authors: Jeon, Dong Su; Park, Ju Hyun; Kang, Dae Yun; Dongale, Tukaram D.; Kim, Tae Geun Journal: Materials science in semiconductor processing Issue: Volume 110(2020) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗