1. A defect-oriented test approach using on-Chip current sensors for resistive defects in FinFET SRAMs. (September 2018) Authors: Medeiros, G.C.; Bolzani Poehls, L.M.; Taouil, M.; Luis Vargas, F.; Hamdioui, S. Journal: Microelectronics and reliability Issue: Volume 88/90(2018) Page Start: 355 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗