1. A Built-In Self-Test Structure (BIST) for Resistive RAMs characterization: Application to bipolar OxRRAM. (January 2015) Authors: Aziza, H.; Bocquet, M.; Moreau, M.; Portal, J-M. Journal: Solid-state electronics Issue: Volume 103(2015) Page Start: 73 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗