1. Bipolar Ni/ZnO/HfO2/Ni RRAM with multilevel characteristic by different reset bias. (July 2015) Authors: Hsieh, Wei-Kang; Lam, Kin-Tak; Chang, Shoou-Jinn Journal: Materials science in semiconductor processing Issue: Volume 35(2015:Jul.) Page Start: 30 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗